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Specifies the name of the DENZO x-file. An x-file will be produced by DENZO after indexing the diffraction pattern, refinement, and integration using the command calculate go. The x-file contains the information about the crystal orientation, unit cell parameters, wavelength of the X-ray beam, crystal to detector distance, direct beam position on the detector, detector misorientation parameters, resolution limits, starting oscillation angle and the oscillation range.

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