Eval15

Introduction
Getting started
Help
Version history

Introduction

Eval15 is a powerfull predicted-profile fitting method for single crystal X-ray diffraction data on area detectors. The predicted profiles are based on knowledge about the exact experimental setup.

The eval15 method is described in:
A.M.M. Schreurs, X. Xian and L.M.J. Kroon-Batenburg
EVAL15: a diffraction data integration method based on ab initio predicted profiles
J. Appl. Cryst. 43, (2010) 70-82
A reprint (Copyright © International Union of Crystallography) can be found here.

Getting started

If you run eval15 for the first time, you may want to use the menu command to define the initial set of parameters.

Help

By typing help at the Eval15 prompt, a browser will be started to display this documentation.

Version history


EVPY Suite Overview