Eval Program Suite

Eval14 and eval15 are integration methods for single crystal X-ray diffraction on area detectors. Both methods use knowledge about the exact experimental setup. The eval15 method is described in:
A.M.M. Schreurs, X. Xian and L.M.J. Kroon-Batenburg
EVAL15: a diffraction data integration method based on ab initio predicted profiles
J. Appl. Cryst. 43, (2010) 70-82
A reprint (Copyright © International Union of Crystallography J. Appl. Cryst. 43, (2010) 70-82) can be found here (PDF file, 1.1 Mb).

The eval14 method is described in:

A.J.M. Duisenberg, L.M.J. Kroon-Batenburg and A.M.M. Schreurs
An intensity evaluation method: EVAL-14
J. Appl. Cryst. 36, (2003) 220-229.
A reprint (Copyright © International Union of Crystallography J. Appl. Cryst. 36, 220-229) can be found here (PDF file, 820 kb).

Availability

The package is available, free of charge, for academic purposes. The latest version was build at 1 June 2017.
Download- and installation instructions will be sent after the reception of a filled-in license form. A username/password is needed to access the download directory.

Documentation

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